Advanced Pattern Recognition.
Abstract
The Advanced Pattern Recognition effort has provided additional enhancements to the RADC Image Processing System (IPS) for developing a variety of techniques in performing target detection and identifications. These extensions include the extraction of features based on edge and region information in addition to the normal pixel classification methods. This capability now permits both statistical and symbolic classification of pixels and objects. Further improvements provide the ability to develop and apply artificial intelligence in the form of rules for extracting features automatically. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1983
- Accession Number
- ADA132339
Entities
People
- James L. Cambier
- Scott A. Barrett
- Stephen Barth
- William J. Reid