Emission of Short-Wavelength Photons from Ion-Surface Charge Exchange.

Abstract

The intensity of radiation emitted from ion-surface charge-exchange processes can be significantly enhanced if the surface exposed to impinging ions is electronically excited. Alpha particles capturing electrons at a silicon surface are considered as a possible candidate for a short-wavelength laser.

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1983
Accession Number
ADA133183

Entities

People

  • Hai-woong Lee
  • Thomas F. George

Organizations

  • University of Rochester

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Alpha Particles
  • Corpuscular Radiation
  • Electromagnetic Radiation
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Emission
  • Fermions
  • Intensity
  • Ionizing Radiation
  • Nuclear Radiation
  • Particles
  • Radiation
  • Short Wavelengths
  • Subatomic Particles

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics

Technology Areas

  • Directed Energy
  • Microelectronics
  • Quantum Science - Quantum Dots