Analog Fault Diagnosis of Large-Scale Electronic Circuits.

Abstract

The long-term objective of this research is to develop a practical and reliable Automatic Test Program Generator (ATPG) which will allow us to locate the faulty component(s) of a large analog circuit when it is faulty. The short-term objective is to search for viable and amenable concepts under which long-term objectives can be achieved. During this short period, some significant progress has been made.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1983
Accession Number
ADA133491

Entities

People

  • Ruey-wen Liu

Organizations

  • University of Notre Dame

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Cyber
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Algorithms
  • Amplifiers
  • Closed Loop Systems
  • Computational Complexity
  • Computational Science
  • Computer Science
  • Control Systems Engineering
  • Digital Circuits
  • Electrical Engineering
  • Electronic Circuits
  • Electronic Equipment
  • Graph Theory
  • Mathematical Filters
  • Military Research
  • Network Science
  • Operational Amplifiers
  • Two Dimensional

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics