The Influence of Surface Roughness on the Transfer and Wear of Polymers.

Abstract

Wear mechanisms of polymer sliding systems were studied. The wear rates of rigid polyvinyl chloride and low density polyethylene pins sliding on ground steel disks decreased as the average asperity curvature and the depth of penetration of the asperities in the polymer decreased. Observation of the sliding of polycarbonate and polyvinly chloride disks against model asperities in the scanning electron microscope showed that elastic and plastic flow of the polymers around the asperities was much more evident than the formation of wear particles by fracture. A steel ball sliding on polycarbonate, polyvinyl chloride, polyethyleneterephthalate, and three polymides required 20 to 550 cycles of sliding before wear particles started to form. The fatigue wear of polymide films on steel substrates in a ball on polymide test was lowest for the polymide with the lowest t sug g, and lowest modulus. The wear of polytetrafluoroethylene was found to decrease as the molecular weight and crystallinity increased. The wear debris had lower molecular weight but slightly increased crystallinity. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1983
Accession Number
ADA133527

Entities

People

  • Norman S. Eiss Jr

Organizations

  • Virginia Tech

Tags

Communities of Interest

  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Dielectric Polymers
  • Electron Microscopes
  • Engineering
  • Friction
  • Geometry
  • Low Density
  • Materials
  • Materials Processing
  • Materials Science
  • Mechanical Engineering
  • Molecular Weight
  • Plastics
  • Polyethylenes
  • Polyvinyls
  • Resins
  • Scanning Electron Microscopes
  • Surface Roughness

Fields of Study

  • Materials science

Readers

  • Mathematics or Statistics
  • Polymer Science and Engineering.
  • Tribology (the study of the boundary interaction between sliding surfaces, lubrication, wear and friction).

Technology Areas

  • Microelectronics