Study of 1/f Noise in Solids.

Abstract

Noise measurements were made on gold metal films. The noise above 150K is of the form 1/f to the 1.2 power; below 150K the noise goes as 1/f with a maximum near 80K, then a continued decrease. The noise in GaAs n+n-n+ mesas of submicron dimensions is very low. The Hooge parameter is of the order of 10 to the minus 7th power, indicating that collisions are nearly absent. Intervally electron transfer is noticeable in samples with 1.1 micrometer dimensions. The n+p-n+ structures have a great deal of noise associated with the prepunch-though current. This is attributed to recombination of injected electrons via empty acceptors, since in the unexcited specimen there are no holes due to electron spillover. For the first time 1/f noise was observed in radioactive alpha particle decay from 241 Americium. This noise was deduced from counting statistics using the Allan variance theorem. Calculations yielded quantitative accounts for the mobility-fluctuation noise associated with impurity scattering for silicon and gold.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1983
Accession Number
ADA133856

Entities

People

  • Carolyn M. Van Vliet
  • Gijs Bosman

Organizations

  • University of Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Alpha Particles
  • Boltzmann Equation
  • Computational Science
  • Crystal Lattice Vibrations
  • Detectors
  • Electrical Engineering
  • Electronics Laboratories
  • Fermi Levels
  • Measurement
  • Modules (Electronics)
  • Quantum Mechanics
  • Random Variables
  • Scattering
  • Semiconductor Devices
  • Semiconductors
  • Stochastic Processes
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Acoustics.
  • Materials Science and Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics