Thermal Property Measurement Techniques and Some Results for CdTe

Abstract

This Quarterly report describes the techniques used to measure the thermal coefficient of expansion and the emissivity of Cadmium Telluride. It presents some results found using these techniques. The report also describes a gradient layer calorimeter that will be used to measure the specific heat of semiconductor materials at high temperatures.

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Document Details

Document Type
Technical Report
Publication Date
Sep 10, 1983
Accession Number
ADA133899

Entities

People

  • C. M. Sabin
  • D. J. Connelly
  • H. F. Poppendiek

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Calibration
  • Calorimeters
  • Coefficients
  • Earth Sciences
  • Emissivity
  • Gallium Arsenides
  • Heat Energy
  • Heat Flux
  • Heat Loss
  • High Temperature
  • Materials
  • Measurement
  • Semiconductors
  • Specific Heat
  • Surface Temperature
  • Temperature Gradients
  • Thermal Properties

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Technical Research and Report Writing.
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems