The Heating and Failure of Microelectronic Wires from an Electric Pulse.
Abstract
A derivation was made of equations governing the temperature profiles in microelectronic wires. Using these equations, the profiles were plotted for gold and aluminum wires at the minimum voltages required for failure and at two higher voltages. Curves were also plotted for the time required to reach the melting point of the wires as a function of the applied voltage. Finally, curves were plotted for the energy required to raise the wire temperature to the melting point as a function of applied voltage. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1982
- Accession Number
- ADA134592
Entities
People
- Vernon A. Nieberlein
Organizations
- United States Army Aviation and Missile Command