Reliability Modeling of Critical Electronic Devices.
Abstract
This report presents failure rate prediction procedures for magnetrons, vidicons, cathode ray tubes, semiconductor lasers, helium-cadmium lasers, helium-neon lasers, Nd:YAG lasers, electronic filters, solid state relays, time delay relays (electronic hybrid), circuit breakers, I.C. Sockets, thumbwheel switches, electromagnetic meters, fuses, crystals, incandescent lamps, neon glow lamps and surface acoustic wave devices. Collected field failure rate data were utilized to develop and evaluate the procedures. The reliability prediction procedures are presented in a form compatible with MIL-HDBK-217. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1983
- Accession Number
- ADA135705
Entities
People
- D. W. Coit
- J. J. Steinkirchner
Organizations
- IIT Research Institute