Analysis and Testing of Radiation-Induced Transient Effects in Complex Microcircuits

Abstract

Analytical and experimental considerations in assessing transient effects of microcircuits exposed to a pulsed radiation environment are summarized tutorially with extensive references. The report represented the notes associated with lectures given at the 1981 and 1982 IEEE Radiation Effects Conference Short Course.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1982
Accession Number
ADA135814

Entities

People

  • J. P. Raymond

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Alpha Particles
  • Bipolar Junction Transistors
  • Circuit Analysis
  • Computer Programs
  • Cosmic Rays
  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Ionizing Radiation
  • Logic Gates
  • P-N Junctions
  • Power Electronics
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Software Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics