Symposium on Advanced Methods of Catalyst Characterization, November 1-2, 1982.

Abstract

The objective of the symposium was to present, discuss, and evaluate the most advanced state-of-the-art methods that can be used for the characterization of heterogeneous catalysts down to atomic and molecular level. The 30 presented papers covered applications of very high resolution transmission (TEM); and scanning transmission (STEM) electron microscopy, in situ TEM studies, and high resolution analytical STEM; characterization and preparation of metal clusters and encapsulation of small particles; spectroscopic studies of catalysts and their surfaces, particularly solid state spin-echo and magic angle spinning NMR, Fourier transform infrared, including beam deflection spectroscopy, EXAFS, SIMS, ISS, and Mossbauer spectroscopic investigations. The Symposium program and abstracts are attached in Appendix I. Fifteen full papers will appear, along with the abstracts, in a late 1983 issue of the Journal of Molecular Catalysis. The Symposium was international in scope, with six foreign speakers from the United Kingdom, Netherlands, and Mexico.

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Document Details

Document Type
Technical Report
Publication Date
May 18, 1983
Accession Number
ADA136209

Entities

People

  • K. Klier

Organizations

  • Lehigh University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Alkanes
  • Chemical Analysis
  • Chemical Engineering
  • Chemical Reaction Properties
  • Chemical Synthesis
  • Chemistry
  • Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Mass Spectrometry
  • Materials
  • Materials Processing
  • Materials Science
  • Measurement
  • Microscopy
  • Spectra
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Academic Conference Management
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics