X-Ray Topographic Measurements of Strain Fields.

Abstract

This report describes a new technique which allows the determination of strain components in solids with a spatial resolution of about 10 micrometers. The method uses x-ray topography and may be applied to specimens which have relatively high dislocation contents. The technique may be used for thin specimens as well as relatively thick ones. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1983
Accession Number
ADA136310

Entities

People

  • Haoze Chen
  • Howard K. Birnbaum
  • S. R. Stock

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Absorption
  • Bragg Angle
  • Diffraction
  • Electron Microscopy
  • Engineering
  • Geometry
  • Materials
  • Materials Science
  • Measurement
  • Microscopy
  • Military Research
  • Mining Engineering
  • Radiation
  • Scanning Electron Microscopy
  • Single Crystals
  • Synchrotron Radiation
  • X Rays

Readers

  • Aerospace Test and Evaluation
  • Materials Science and Engineering.
  • Nanofabrication and Microfabrication.