Development of a Planar Heterojunction Bipolar Transistor for Very High Speed Logic.

Abstract

The objective of this project was to fabricate multiple heterostructure bipolar transistors in semi-insulating GaAs substrates. During the first year of effort, molecular beam epitaxial growth of doped aluminum-gallium arsenide (AlGaAs) gallium arsenide (GaAs) heterojunctions was carried out. GaAs layers were doped n-type with silicon from the background (1E16) up to 2E18 and p-type with beryllium up to 1E19. N-type AlGaAs was grown up to 30% aluminum composition and doped with silicon to 1.5E18. Tools were developed for lateral structuring of transistors such as beryllium ion implantation, reactive sputtering and thermal annealing. Single devices were grown, fabricated by mesa etching and tested. Current-voltage characteristics shows evidence of excess recombination current. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1983
Accession Number
ADA136341

Entities

People

  • S. I. Long

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aluminum
  • Annealing
  • Beryllium
  • Bipolar Junction Transistors
  • California
  • Ceramic Materials
  • Electrical Properties
  • Energy Bands
  • Epitaxial Growth
  • Heterojunction Bipolar Transistors
  • Heterojunctions
  • Implantation
  • Ion Implantation
  • Materials
  • Measurement
  • Molecular Beams
  • Transistors

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics