Basic Mechanisms of Radiation Effects on Electronic Materials, Devices, and Integrated Circuits

Abstract

This report describes in a tutorial manner the basic mechanism of radiation effects on electronic materials, devices, and integrated circuits. Radiation effects in bulk silicon and in silicon devices are treated. Ionizing radiation effects in silicon dioxide films and silicon MOS devices are discussed. Single event phenomena are considered. Key literature references and a bibliography are provided.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1982
Accession Number
ADA136393

Entities

People

  • Joseph. R. Srour

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Electron Density
  • Electronics Industry
  • Energy Bands
  • Failure Mode And Effect Analysis
  • Fermi Levels
  • Field Effect Transistors
  • Integrated Circuits
  • Ionization
  • Ionizing Radiation
  • Modules (Electronics)
  • Neutron Bombardment
  • Nuclear Reactors
  • Optical Properties
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Nuclear and Radiation Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics