Simulation of Edge Effects in Electroanalytical Experiments by Orthogonal Collocation. Part 4. Application to Voltammetric Experiments.
Abstract
Orthogonal collocation is used to simulate cyclic voltammograms that are influenced by non-linear diffusion due to edge effects at small disc electrodes. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 06, 1984
- Accession Number
- ADA136988
Entities
People
- A. S. Hinman
- B. Speiser
- J. F. Cassidy
- Stanley Pons
Organizations
- University of Utah