Reliability Analysis of Multi-Components Systems.

Abstract

The reliability of systems consisting of many semiconductor devices is estimated from the results of an accelerated temperature aging test program. This work is an extension of our previous analysis of accelerated aging, in which we assumed that the results from a Student-t analysis can be applied directly to a multi-component amplifier in the classical combinatory manner. In this work we no longer make this assumption but employ a computer simulation to obtain a more efficient estimation of the reliability of an amplifier consisting of many semiconductor devices. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 15, 1983
Accession Number
ADA138013

Entities

People

  • M. F. Millea

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Amplifiers
  • Chemical Reactions
  • Computer Simulations
  • Electronics
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Information Science
  • Laser Spectroscopy
  • Lasers
  • Materials
  • Materials Science
  • Normal Distribution
  • Physics Laboratories
  • Semiconductor Devices
  • Semiconductors
  • Space Systems
  • Statistical Analysis

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Nanocomposite Materials Science
  • Regression Analysis.

Technology Areas

  • Microelectronics