Bayesian Reliability Test Plans for One-Shot Devices
Abstract
This report develops statistical reliability test plans for systems which are not continuously operating such as missiles, bombs, and fuzes. The test plans are Bayesian in the sense that existing test data may be used to reduce the sample sizes required for subsequent testing. The prior probability density function of reliability is based upon this objective existing test data and is used to derive expressions for both producer's and consumer's posterior risks. Tables are provided for the practicing reliability manager to use in designing subsequent tests to meet threshold values of producer's and consumer's posterior risks.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1983
- Accession Number
- ADA138234
Entities
People
- B. B. Wood
Organizations
- United States Air Force Academy