Producible Alternative to CdTe for Epitaxy (PACE-2) of LWIR HgCdTe

Abstract

This report covers the progress made toward the achievement of device quality LWIR HgCdTe on an alternate substrate. Epitaxial layers of CdTe have been grown on GaAs, Si and Ge substrates by LADA, MBE and OM-VPE. The bulk-like qualities have been found for CdTe grown on GaAs and Si. Layers of CdTe on Si lack spatial uniformity due to an extended and difficult nucleation cycle. CdTe layers grown by OM-VPE on GaAs and Ge substrates show a higher defect density than those grown by MBE or LADA. LPE HgCdTe layer growth on CdTe/GaAs, CdTe/Si and CdTe/Ge substrates resulted in chemical attack of the base substrate. Epitaxial layers of HgCdTe on these same substrates were achieved by an isothermal VPE growth technique.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1984
Accession Number
ADA138255

Entities

People

  • E. R. Gertner

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Crystal Growth
  • Crystals
  • Diffraction
  • Electron Spectroscopy
  • Epitaxial Growth
  • Films
  • Materials
  • Measurement
  • Phase
  • Single Crystals
  • Spectra
  • Substrates
  • Vapor Phases
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.