Precise Measurement of Refractive Index and Absorption Coefficient of Near Millimeter Wave and Far Infrared Materials
Abstract
It is no longer necessary to use extrapolated microwave dielectric values when designing millimeter wave components and systems. Our recent highly accurate broadband millimeter wave data on complex refractive index, complex refractive index, complex dielectric permittivity and loss tangent are now available to engineers for a variety of materials such as common ceramics, semiconductors, crystalline and glass materials. The fact that dielectric loss increases with frequency in the millimeter, unlike the microwave, is an important feature of our data. Reliable measurements also reveal that the methods of preparation of nominally identical specimens can change the losses by a factor of three.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1983
- Accession Number
- ADA138656
Entities
People
- K. J. Button
- M. N. Afsar
Organizations
- Massachusetts Institute of Technology