Latchup Window Tests.

Abstract

This report addresses the very important issue of latchup windows in integrated circuits. This is a serious problem and requires careful consideration in each individual case of system design. Latchup may cause system failure through burnout of the device or through an upset of the circuit in which latchup occurs. The existence of a latchup window was first reported by researchers performing latchup testing of MOS integrated circuits (Refs. 1,2). It was found that latchup would occur in some devices for only a small range of dose rates. At dose rates below a critical value, the device would not experience latchup. A second higher dose rate range was found where latchup would again not occur. These tests were performed using high-energy electrons (Linac) and were performed on CMOS, CD4000 series devices.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1983
Accession Number
ADA138680

Entities

People

  • J. Azarewicz
  • W. Hardwick

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Birds
  • Detectors
  • Dose Rate
  • Dosimetry
  • Electron Energy
  • Electrons
  • Energy
  • High Energy
  • Linear Accelerators
  • Measurement
  • Power Supplies
  • Radiation Effects
  • Scattering
  • Semiconductors
  • Test And Evaluation
  • Test Facilities
  • Weapons Effects

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems