Analysis of Transmission Lines on Semiconductor Substrate.

Abstract

An efficient numerical method based on the application of Galerkin's method in the spectal domain is proposed to obtain the propagation constant and characteristic impedance of planar transmission lines used in monolithic microwave integrated circuits. First, the transmission-line properties of a conductor-backed coplanar waveguide are analyzed. For a fixed substrate thickness, the characteristic impedance and phase constant may be varied independently by adjusting the width of the center strip and slots in the transmission line. Then microstrip lines and coplanar be varied independently by adjusting the width of the center strip and slots in the transmission line. Then microstrip lines and coplanar waveguides formed with MIS and Schottky barrier contacts are analyzed. Depending on the frequency and the resistivity of the semiconductor substrate, three different types of fundamental modes are predicted. The calculated slow-wave factors and attenuation constants agree well with experimental results. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1984
Accession Number
ADA140711

Entities

People

  • Takeki Itoh
  • Y. C. Shih

Organizations

  • University of Texas at Austin

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computer-Aided Design
  • Coordinate Systems
  • Dielectrics
  • Electric Fields
  • Electrical Engineering
  • Electromagnetic Fields
  • Equations
  • Equivalent Circuits
  • Frequency
  • Metal-Semiconductor Junctions
  • Monolithic Microwave Integrated Circuits
  • Semiconductors
  • Thickness
  • Transmission Lines
  • Two Dimensional
  • Wave Propagation
  • Waveguides

Fields of Study

  • Engineering
  • Physics

Readers

  • Microwave Engineering.

Technology Areas

  • Microelectronics