Symposium on Applied Surface Analysis (5th) Held at Dayton, Ohio on 8-10 June 1983.

Abstract

The 5th Symposium on applied Surface Analysis was held at the University of Dayton, 8-10 June 1983. This Symposium was held to met a need, namely to show the transition between basic surface science research and applications of this research to areas of Department of Defense interest. Areas receiving special attention at this Symposium were chemical bonding and reactions at metal-semiconductors interfaces, surface analysis and the tribological processes of ion implanted materials, microbeam analysis and laser ionization of sputtered neutrals. Other topics discussed included adsorption, adhesion, corrosion, wear, and thin films. Approximately 110 scientists active in the field of surface analysis participated in the Symposium. Four scientists presented invited papers at the Symposium. There were 29 contributed presentations. The proceedings of the Symposium are being published in a special issue of the journal Applications of Surface Science by North-Holland Publishing Company.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1984
Accession Number
ADA140744

Entities

People

  • J. T. Grant

Organizations

  • University of Dayton

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemical Compounds
  • Chemical Reactions
  • Chemical Synthesis
  • Chemistry
  • Compound Semiconductors
  • Factor Analysis
  • Governments
  • Ionization
  • Mass Spectrometry
  • Material Degradation Processes
  • Materials
  • Materials Laboratories
  • Materials Science
  • Semiconductors
  • Spectra
  • Spectrometry
  • Surface Properties

Fields of Study

  • Physics

Readers

  • Technical Research and Report Writing.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Graphene