Development of FT-IR Attenuated Total Internal Reflection Dichroism Techniques for Structural Characterization of Polymer Surfaces.

Abstract

We describe our continuing effort to develop FT-IR attenuated total reflection (ATR) dichroism techniques for the characterization of polymer surface structure and molecular orientation. Following theoretical background, we review the two-dimensional and three-dimensional analyses work based on a specially designed internal reflection crystal and a specially built ATR-sample attachment. In the current development section, we describe briefly the intensity correction procedures used in variable angle studies and an attempt to design a hemispheric crystal attachment to eliminate problems encountered with face-cut reflection crystals.

Document Details

Document Type
Technical Report
Publication Date
Apr 17, 1984
Accession Number
ADA140805

Entities

People

  • C. S. P. Sung
  • J. P. Hobbs

Organizations

  • Massachusetts Institute of Technology

Tags

DTIC Thesaurus Topics

  • Attachment
  • Dichroism
  • Electromagnetic Radiation
  • Geometry
  • Intensity
  • Mathematics
  • Orientation (Direction)
  • Physical Properties
  • Radiation
  • Reflection
  • Sizes (Dimensions)
  • Three Dimensional
  • Total Internal Reflection
  • Two Dimensional

Fields of Study

  • Chemistry

Readers

  • Polymer Science and Technology
  • Software Engineering
  • Spectroscopy.