Superconducting Electronic Film Structures.

Abstract

Single crystal NbN films were prepared on sapphire having a (2,-1,-1,3) surface orientation. Electron diffraction and Laue data show that the NbN and sapphire orientations are related, proving epitaxial growth. A15 structure V-Si and for the first time A15 Nb-Ge films were prepared reproducibly by a reactive sputtering process. These compounds were formed at temperatures as low as 500 C with critical temperatures above 12K. Niobium films were prepared at less than 100 C with critical temperatures greater than 9K. Epitaxial quality A15 Nb-Ir single crystal substrates were prepared. A new magnetron sputtering system was implemented. Progress on the assembly and implementation of a MBE-type deposition and in situ analytical facility is reported. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 11, 1984
Accession Number
ADA141113

Entities

People

  • A. I. Braginski
  • J. R. Gavaler

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Critical Temperature
  • Crystallization
  • Crystals
  • Diffraction
  • Electron Diffraction
  • Electrons
  • Epitaxial Growth
  • Films
  • Low Temperature
  • Magnetrons
  • Materials
  • Orientation (Direction)
  • Sapphire
  • Single Crystals
  • Sputtering
  • Transition Temperature

Fields of Study

  • Physics

Readers

  • Superconducting Magnet Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene