Schottky Barrier Photoelectrodes with a Variable Barrier Height.

Abstract

The purpose of this research is to investigate the properties of Schottky barriers formed between semiconductors and ion insertion compounds having continuously and reversibly variable work functions. In Phase I, the diode p-Si/M(x)WO3 (M = H, Li) was studied. Li(x)WO3 thin films, prepared by vacuum evaporation or sputtering, showed work functions spanning the range 4.2-5.2 eV for x = 0 to 0.4. Electrical measurements on solid state diodes employing Li(x)WO3 layers revealed a barrier height modulation of 0.06V for this range, limited by significant Fermi level pinning. Photoelectrochemical measurements of H(x)WO3 coated p-Si electrodes showed that the ion insertion compound enhanced electrode stability and photoresponse in acidic electrolytes. The band bending in naked and coated p-Si electrodes was measured as a function of applied bias using a new technique assessing saturation photovoltage as the electrode is polarized. The slope of these curves, (dVB/dV), is related inversely to the interface state density, Ds. Ds was significantly reduced by the H(x)WO3 overlayer. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1984
Accession Number
ADA141813

Entities

People

  • D. R. Rogers
  • R. D. Rauh

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carbonate Esters
  • Chemical Synthesis
  • Chemistry
  • Dye Lasers
  • Electrical Measurement
  • Electrochemical Cells
  • Electrochemical Reactions
  • Electrodes
  • Electronics Industry
  • Electronics Laboratories
  • Energy Bands
  • Materials
  • Measurement
  • Schottky Diodes
  • Semiconductor Devices
  • Semiconductors
  • Thin Films

Fields of Study

  • Materials science

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  • Electrochemical Surface Science
  • Materials Science and Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene