Insulating Films on GaAs.

Abstract

This project was an experimental investigation of the formation and the electrical characteristics of thin insulating layers on the compound semiconductor gallium arsenide, GaAs. The primary objective of the study was to obtain fundamental knowledge of the insulator-semiconductor interface for thin film structures formed by two different methods: (1) growth of oxide layers by plasma anodization, and (2) chemical vapor deposition of silicon nitride layers by a low temperature plasma-enhanced technique and a high temperature pyrolytic process. A secondary objective was to develop thin insulating films that may be suitable for surface passivation of GaAs devices. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 1979
Accession Number
ADA141867

Entities

People

  • G. Y. Robinson

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Band Gaps
  • Ceramic Materials
  • Chemical Vapor Deposition
  • Compound Semiconductors
  • Dielectrics
  • Electrical Measurement
  • Electrical Properties
  • Electron Spectroscopy
  • Films
  • Gallium Arsenides
  • High Temperature
  • Low Temperature
  • Materials Processing
  • Semiconductors
  • Vapor Deposition

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene