Characterization of the Microstructures of Various Materials.

Abstract

Research on characterization of microstructures of alloys and non-metallic materials is summarized. The emphasis was on improvements in the appreciation of electron-optical and optical-microscopy methods for determining the morphology, crystallography, and composition of the materials. Alloys studied included those of Al, Ti, and Ni base prepared by ingot, cast, and rapid-solidification methods. Non-metals were polymers and composites of various formulations. Accomplishments included installation of a scanning transmission electron microscope with energy dispersive spectrometry and electron energy loss spectrometers, installation of an ultramicrotome for preparation of nonmetallic specimens, development and improvements of specimen-preparation techniques applied to non-metallics, metal powders, and metallurgical specimens, documentation of microstructures, formulation of analytical methods to provide compositional data, and construction of a simple apparatus for generating experimental quantities or rapidly solidified alloys. Papers and presentations authored or co-authored by personnel are listed. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1984
Accession Number
ADA141946

Entities

People

  • A. G. Jackson
  • C. E. Harper
  • R. D. Brodecki
  • R. E. Omlor
  • R. J. Bacon

Tags

Communities of Interest

  • Energy and Power Technologies
  • Human Systems
  • Space

DTIC Thesaurus Topics

  • Chemical Synthesis
  • Chemistry
  • Composite Materials
  • Construction
  • Crystal Structure
  • Electron Microscopes
  • Electron Microscopy
  • Electropolishing
  • Engineers
  • Governments
  • Materials
  • Materials Engineering
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Microscopes
  • Microscopy

Fields of Study

  • Materials science

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Technical Research and Report Writing.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics