Measurement of Soft X-Ray Absorption Spectra with a Fluorescent Ion Chamber Detector.
Abstract
Absorption spectra at the K-edges of S, C1, Ar, and K have been measured in fluorescence mode on the hard x-ray beam lines at SSRL using an ion chamber detector collecting 20% of 2 pi. In spite of diminished x-ray flux and fluorescent yield, sufficient sensitivity was obtained to characterize one percent S in coal. On an unfocused wiggler beam line a resolution of 0.5 eV was obtained at the S K-edge. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 23, 1984
- Accession Number
- ADA142213
Entities
People
- D. R. Sandstrom
- E. C. Marques
- F. W. Lytle
- Joel Wong
- R. B. Greegor
Organizations
- Washington State University