Proton-Induced Single Event Upsets in the SBP9989 Microprocessor.

Abstract

This report describes the investigation of proton-induced single event upsets in the SBP9989 micro-processor fabricated by Texas Instruments, Inc. Ten different devices with various date codes were tested. Total dose failure occurred in five of these devices after 10 to the 12th power protons per sq cm. An average upset cross section of 6 times 10 to the minus 12th power upset-sq cm/proton-device was observed. Comparison with cosmic ray-induced upsets indicates that proton-induced upsets represent a more severe problem for satellites with orbits between 600 and 2500 nautical miles. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 12, 1984
Accession Number
ADA142448

Entities

People

  • A. B. Campbell
  • D. Emily
  • E. L. Petersen
  • L. T. Myers
  • P. Shapiro

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Artificial Satellites
  • Availability
  • Circuits
  • Circular Orbits
  • Classification
  • Cosmic Rays
  • Cyclotrons
  • Instructions
  • Ions
  • Logic
  • Logic Gates
  • Measuring Instruments
  • Microprocessors
  • Orbits
  • Particle Flux
  • Radiation
  • Security

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Mathematics or Statistics
  • Space Exploration and Orbital Mechanics.

Technology Areas

  • Space
  • Space - Hall-Effect Thruster