Thomson Backscattering from an Intense Relativistic Electron Beam as a Diagnostic for a Free Electron Laser

Abstract

The parallel momentum spread of an intense relativistic electron beam (1 KA/CC, 700 KV) used in a Raman free electron laser, is determined by a Thomson backscattering experiment. Theory is reviewed to show that the relativistic effect combines with the backscattering geometry to provide maximum energy resolution, sensitivity, and scattered signal level for the energy diagnostic experiment. The electron beam is field-emitted from a cold cathode, apertured by the anode, and guided by a 9.5 KG magnetic field to scatter the 20 MW peak power, mode-locked 9.6 micrometer C02-laser radiation. The electron beam is found to have adequate qualities for Raman free electron laser applications: A normalized beam energy spread of (0.6 + or - 0.14) % is obtained from the frequency-upshifted backscattered spectrum centered at 0.5 micrometer. It is also found that the use of the 1.7 cm period radially dependent undulator field introduces extra inhomogeneous broadening on the electron beam -- the momentum spread increases monotonically with the undulator field strength.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1984
Accession Number
ADA143027

Entities

People

  • S. C. Chen
  • T. C. Marshall

Organizations

  • Columbia University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Backscattering
  • Differential Cross Sections
  • Diffraction
  • Electromagnetic Radiation
  • Electromagnetic Scattering
  • Electromagnetic Shielding
  • Electron Density
  • Free Electron Lasers
  • Laser Applications
  • Laser Beams
  • Lasers
  • Measurement
  • Particle Physics
  • Physics Laboratories
  • Quantum Electrodynamics
  • Scattering
  • Scattering Cross Sections

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Solar Physics
  • Spectroscopy.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics