Photothermal Analysis of Thin Films.

Abstract

Applications of photothermal depth profiling are described. Most recent results demonstrate the use of thermal delay lines and multiplex techniques. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 10, 1984
Accession Number
ADA144472

Entities

People

  • H. Coufal
  • P. Hefferle

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Absorption
  • Absorption Spectra
  • Abstracts
  • Delay Lines
  • Detection
  • Detectors
  • Films
  • Frequency
  • Frequency Domain
  • Governments
  • Lasers
  • Military Research
  • Quantum Yields
  • Radiation
  • Security
  • Thin Films
  • Wave Propagation