Gradient Index Lens Research.
Abstract
This contract has been divided into four major tasks. A method for nondestructive testing of any gradient index sample independent of a base index of refraction has been developed. The method is based on ellipsometry and permits the index of refraction to be measured for both visible and infrared wavelengths in a semi-automatic way. The technique, called Phase Lock Ellipsometry, measures the surface index of refraction. A number of indices of refraction can be measured with this, particularly those that transmit only in the infrared portion of the spectrum. These include zinc selenide, cadmium sulfide, zinc sulfide and glass samples. A gradient index germanium component has been fabricated using a gradient of silicon and germanium. The index change in the sample is 0.13 and the depth of the gradient is approximately 10 mm. This type of sample is well suited for FLIR-type optics. An f/2 imaging system with a field of view of 20 degrees has been designed for infrared imagery. Finally, the technique for manufacturing large radial gradients have been investigated. Two general techniques were investigated. Electric field assisted diffusions and phase separated glasses. Neither technique was completely successful and more work needs to be done on each of them. A brief summary of the problems of each is included. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 25, 1982
- Accession Number
- ADA145544
Entities
People
- D. T. Moore
Organizations
- University of Rochester