Life Distribution Properties of Devices Subject to Deterioration. Research Progress.

Abstract

Research during this period concentrated on the following areas: (1) life distribution properties of devices subject to a pure jump damage process; (2) a power transformation exponential regression model for censored failure time data; (3) stability of optimal replacement problems; (4) an iterative scheme for approximating optimal replacement policies; and (5) stability of optimal stopping problems. This report summarizes progress in these areas. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 27, 1984
Accession Number
ADA145554

Entities

People

  • M. Abdel-hameed

Organizations

  • University of North Carolina at Charlotte

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Force
  • Computer Science
  • Convergence
  • Diffusion
  • Dynamic Programming
  • Markov Processes
  • Mathematics
  • New York
  • North Carolina
  • Operations Research
  • Probability
  • Probability Density Functions
  • Random Variables
  • Security
  • Stochastic Processes
  • Weak Convergence

Readers

  • Statistical inference.
  • Technical Research and Report Writing.