Accelerated Stress Facility 1976-1983.

Abstract

The complexities of the electronics on which we will perform reliability assessments can only be achieved through automation. Likewise, the complexities of the reliability assessment can only be met through automation, We must be smart in what failure mechanisms to expect, where to expect them, when to expect them, how to stress for them, and how to recognize them when they occur. We must be smart in what we are looking for, what data we gather, and how we analyze that data. We must be smart in how we specify the devices. We must automate the whole reliability characterization process. The publication documents the developments that have taken place in the RADC/RBRP Accelerated Stress Facility (ASF) for the years 1976 through 1983. Section II highlights the modifications which took the ASF from primarily static bias to dynamic exercise capability. Section III deals with the automation of the stress tests utilizing evaluation kits through a network of microcomputers. It is through this work that the necessity and some of the potentials of automating the reliability characterization process and specifically the stress testing portion have been realized as well as some to the practical aspects of implementing such. Most importantly, Section IV addresses some of those potential applications of automation which will be possible because of the incorporation of computers in the testing process.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1984
Accession Number
ADA146101

Entities

People

  • R. A. Blore

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Adaptive Systems
  • Algorithms
  • Circuit Boards
  • Circuits
  • Computer Programming
  • Computer Programs
  • Computers
  • Data Analysis
  • Databases
  • Electronics
  • Failure Mode And Effect Analysis
  • Identification
  • Measurement
  • Microcircuits
  • Reliability
  • Stress Tests
  • Test And Evaluation

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Life Cycle Cost Analysis
  • Theoretical Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems