Characterization of Surface Electronic Properties of Semi-Insulating InP.

Abstract

The surface and interfacial charge carrier transport properties of semiinsulating InP have been investigated. It is shown that space charge limited current flow in the presence of trapping in conjunction with charge transport in the accumulation layer are present in two-terminal and three-terminal InP structures. Additional originator-supplied keywords include: Surface and Interfacial Properties, and III-V Compound Semiconductors.

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Document Details

Document Type
Technical Report
Publication Date
Sep 26, 1984
Accession Number
ADA146553

Entities

People

  • H. H. Wieder

Organizations

  • University of California, San Diego

Tags

DTIC Thesaurus Topics

  • Charge Carriers
  • Compound Semiconductors
  • Computers
  • Crystal Lattices
  • Electric Fields
  • Electrical Engineering
  • Electron Density
  • Electron Mobility
  • Fermi Levels
  • Field Effect Transistors
  • Free Electrons
  • Integrated Circuits
  • Mass Spectrometry
  • Materials
  • Measurement
  • Semiconductors
  • Space Charge

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Space