Research on Electroluminescence in Thin Film Yttrium Oxysulfide.

Abstract

Thin films of a rare-earth oxysulfide phosphor, yttrium oxysulfide:europium, were evaluated for use in a thin film electro-luminescent emitter (TFEL). For the first time, emission typical of the rare earth activator was observed in a rare earth host TFEL emitter. The films were characterized for optical spectrum, brightness-voltage characteristic, photoluminescence, crystal structure, and compared to efficient cathodoluminescent powder phosphors, yttrium oxysulfide:europium, as well as high efficiency TFEL emitters of zinc sulfide:manganese. The E-beam deposited films exhibited considerable photoluminescence and cathodoluminescence after a high temperature anneal (600 C). However, the anneal induced cracks in the phosphor film, which in turn limited the maximum applied voltage and electroluminescent brightness to less than 1 ft-L. Alternate substrate materials and process schedules minimized the cracking, but did not eliminate this fundamental problem.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1984
Accession Number
ADA146909

Entities

People

  • L. G. Hale
  • R. D. Ketchpel

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystal Lattices
  • Crystal Structure
  • Dielectric Gases
  • Dielectric Permittivity
  • Dielectrics
  • Diffraction
  • Electric Fields
  • Energy Bands
  • High Temperature
  • Luminescence
  • Measurement
  • Optical Properties
  • Physical Properties
  • Spectra
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Human-Computer Interaction (HCI).
  • Materials Science and Engineering.