Cognitive Speed and Performance in Basic Electricity and Electronics (BE&E) School.

Abstract

A battery of cognitive speed tests was programmed for administration via microcomputer and given to 155 entering students at the BE&E school, Naval Training Center, San Diego. The tests measured (1) reaction time, the time in milliseconds, it takes a subject to respond to simple and complex stimuli, and (2) inspection time, the shortest time, in milliseconds, a subject needs to discriminate which of two briefly presented lines is longer. The substantial relationships found between cognitive speed test scores and rate of progress in the self-paced BE&E course support of the continued investigation of cognitive speed tests as a potentially useful predictor of technical school performance.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1984
Accession Number
ADA147278

Entities

People

  • B. Rimland
  • G. E. Larson

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Cognitive Science
  • Composite Materials
  • Computers
  • Electricity
  • Electronics
  • Information Processing
  • Inspection
  • Military Personnel
  • Military Research
  • Naval Training
  • Navy
  • New York
  • Psychology
  • Reaction Time
  • Schools
  • Students
  • Training

Readers

  • Brain and Cognitive Science; Experimental Psychology; Cognitive Neuroscience
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Psychometric Testing or Psychological Assessment.

Technology Areas

  • Microelectronics