Temperature Dependence of the Crystal Structures of Nylon 11.

Abstract

Careful examination of the X-ray diffraction patterns from melt-crystallized Nylon ll films showed significant discrepancies with the proposed alpha-form structure. These discrepancies did not disappear after annealing the samples. The temperature dependence of the d-spacings of the two strongest peaks showed further evidence that the melt-crystallized and solution cast films (alpha-form) possess different crystal structures. These results suggest a different crystal structure for the melt-crystallized films, and this would help explain the rather low piezoelectric response of these films and also the failure to observe a rapid decrease in polarization at the transition temperature.

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Document Details

Document Type
Technical Report
Publication Date
Sep 28, 1984
Accession Number
ADA147563

Entities

People

  • B. A. Newman
  • J. I. Scheinbeim
  • K. G. Kim

Organizations

  • Rutgers University–New Brunswick

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Annealing
  • Crystal Structure
  • Crystals
  • Diffraction
  • High Temperature
  • Hydrogen Bonds
  • Materials
  • Materials Science
  • Melting Point
  • Military Research
  • New Jersey
  • Phase
  • Thermal Expansion
  • Transition Temperature
  • Transitions
  • X Rays
  • X-Ray Diffraction

Readers

  • Educational Psychology
  • Nanofabrication and Microfabrication.
  • Organic Chemistry

Technology Areas

  • Space