Electrical Characterization of VLSI (Very Large Scale Integration) Memories.

Abstract

Automatic and bench techniques are used to characterize the performance of several VLSI memory types. The characterization addressed AC, DC, program and erasure parameters over the full military voltage and temperature ranges. Data summaries are presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1984
Accession Number
ADA147657

Entities

People

  • J. Schwehr
  • M. Majchrowski
  • P. Lasak
  • R. Mossman

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Access Time
  • Accuracy
  • Boundaries
  • Computer Programming
  • Frequency
  • High Temperature
  • High Voltage
  • Impedance
  • Large Scale Integration
  • Low Temperature
  • Low Voltage
  • Measurement
  • Short Circuits
  • Signal Generators
  • Test And Evaluation
  • Test Equipment
  • Very Large Scale Integration

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.