Developing Double Sampling Plans for Attributes to Meet Sample Size Criteria.

Abstract

This study reports on the development of a FORTRAN IV program to produce double sampling acceptance plans for attributes data. The plans must satisfy two points on an operating characteristic curve, the acceptable quality level point (p1, 1-alpha) and the rejectable quality level (p2, beta). Two models are given. Model I has an additional constraint that the maximum value of the ASN must be less than or equal to the sample size for a corresponding single sampling plan. Model II relieves this constraint. In either case, the resulting plan has a minimum ASN evaluated at the quality level p1 among all sampling plans satisfying the constraints. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1984
Accession Number
ADA148144

Entities

People

  • K. B. Beitler
  • R. S. Leavenworth
  • R. W. Rangarajan

Organizations

  • University of Florida

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Binomials
  • Computations
  • Computer Programs
  • Computers
  • Discrimination
  • Engineering
  • Equations
  • Industrial Engineering
  • Inequalities
  • Probability
  • Procedures (Computers)
  • Rejection
  • Sampling
  • Standards
  • Systems Engineering
  • Two Dimensional

Readers

  • Regression Analysis.
  • Software Engineering