Chemical Information from Ion Scattering Spectrometry.
Abstract
Theory of oscillations in backscattered ion intensity with incident ion energy in Ion Scattering Spectroscopy is reviewed and the analytical potential of this phenomena in surface analysis is demonstrated for a series of closely related lead compounds with the incident energy of the helium probe ion ranging from 500 eV to 4000 eV. These data show Oscillatory Ion Scattering Spectrometry to be very sensitive to the chemical environment of the target atom and so can be used to positively identify the chemical species where ISS cannot.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1984
- Accession Number
- ADA148287
Entities
People
- B. R. Kowalski
- D. J. Veltkamp
Organizations
- University of Washington