Characterization and Selection of Polymer Materials for Binary Munitions Storage. Part 2. Characterization of LLDPE Resins.

Abstract

This work is aimed at determining the materials properties required for storage of DF (methylphosphonic difluoride) over extended periods of time at temperatures as high as 70 C. Earlier studies showed the most likely mode of failure to be environmental stress cracking of the polyolefin container, rather than chemical or oxidative attack. The most promising candidates in terms of resistance to environmental stress cracking are ethylene copolymers with a small alpha-olefin comonomer content. The comonomer, typically butene-1 or hexene-1, introduces short side chain branches which disrupt the regularity of the crystal morphology, presumably leading to a greater proportion of intercrystalline ties. An X-ray diffraction method was developed for measuring the amount of short chain branching which offers greater accuracy than the previous infrared absorption method. Characterization of short chain branching by such a method, along with molecular weight characterization by gel permeation chromatography and crystallinity determination by density, were deemed essential to quality control of resins for the intended application.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1984
Accession Number
ADA148324

Entities

People

  • C. R. Desper

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Alkenes
  • Crystal Lattices
  • Crystal Structure
  • High Density
  • Material Degradation Processes
  • Materials
  • Materials Science
  • Measurement
  • Mechanical Properties
  • Military Research
  • Molecular Weight
  • Plastic Explosives
  • Polymers
  • Stress Cracking
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).
  • Organic Chemistry
  • Systems Analysis and Design

Technology Areas

  • Microelectronics