Reliability Studies of Ceramic Capacitors.

Abstract

The major objective of our research program is to determine the mechanisms which induce intrinsic and extrinsic failure of ceramic capacitors. Towards this end we are making extensive electrical measurements and microstructural evaluations on both commercial and laboratory-prepared specimens. The measurements being performed include: (1) Current as a function of time, temperature, and applied field to evaluate both low and high voltage degradation. (2) Destructive microstructural evaluations. (3) Thermally stimulated polarization/depolarization current (TSPC/DC) measurements. This combination of experiments has provided us with a great deal of information concerning degradation phenomena. The report is divided into three sections: (1) Low voltage degradation, (2) High voltage degradation, and (3) TSPC/DC measurements.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1984
Accession Number
ADA149126

Entities

People

  • D. E. Day
  • H. U. Anderson
  • W. Huebner

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Structures
  • Ceramic Materials
  • Charge Carriers
  • Chemical Synthesis
  • Chemistry
  • Crystal Structure
  • Crystals
  • Curie Temperature
  • Electrical Measurement
  • Energy Bands
  • Failure Mode And Effect Analysis
  • Materials Processing
  • Materials Science
  • Measurement
  • Phase Transformations
  • Point Defects
  • Transition Temperature

Readers

  • Electrical Engineering
  • Materials Science (Mechanical Engineering).
  • Psychometric Testing or Psychological Assessment.