Surface Physics Instrumentation.
Abstract
A surface physics instrumentation system was assembled using components purchased from the DOD Instrumentation Grant in addition to components already present in the laboratory. The system consists of the following parts: Ultrahigh vacuum vacuum system with sample insertion, Auger electron spectrometer, Ion scattering spectrometer, Secondary ion mass spectrometer and work function measuring system. The instrument is a basic tool for preparing and analyzing well defined surfaces in UHV environment. (Author).
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 26, 1984
- Accession Number
- ADA149304
Entities
People
- G. Tompa
- M. Seidl
- W. Carr
Organizations
- Stevens Institute of Technology