A Computer System for Generating Single and Double Sampling Plans for Attributes Data.

Abstract

This study brings together the programs developed in three previous reports into a unified sampling system. One segment contains the single and double sampling plans of MIL-STD-105D along with subroutines that evaluate the normal, tightened and reduced plans including switching rules. Output includes system OC curves, and Average Sample Number (ASN), AOQ, and Average Fraction Inspected (AFI), curves in either graphical or tabular form. Another segment derives single and double sampling plans to satisfy two points designated on the OC curve. An algorithm is employed which seeks to minimize the ASN at a designated Acceptable Quality Level (AQL). The third segment is designed for use when rectifying inspection is employed. It derives single and double sampling plans based on one point on the OC curve, either the process average or a specified AQL value, intended to not exceed a specified Average Outgoing Quality Limit and minimizing the AFI at the process average or specified AQL. Programming is written in FORTRAN IV and development was on a VAX 11-750 computer. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1984
Accession Number
ADA149548

Entities

People

  • K. W. Beitler
  • R. S. Leavenworth

Organizations

  • University of Florida

Tags

Communities of Interest

  • C4I

DTIC Thesaurus Topics

  • Algorithms
  • Binomials
  • Computations
  • Computer Programming
  • Computers
  • Engineering
  • Industrial Engineering
  • Inspection
  • Instructions
  • Operating Systems
  • Precision
  • Probability
  • Procedures (Computers)
  • Rejection
  • Sampling
  • Standards
  • Systems Engineering

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Mathematics or Statistics
  • Software Engineering