Chemical and Localization Effects in Auger Lineshapes of Transition Metal Compounds.

Abstract

The compounds MXn(X=C, N, O) display sequential changes in the C-KLL Auger spectra and these changes in the C-KLL Auger spectra and these changes correlate with the density -of-states (DOS), the relative proportions of ionic, covalent and metallic bonding, and screening and localization of the Auger holes. In this work we quantitatively interpreted the C-KLL lineshape of TiC, using previously described techniques. We further investigated the X-Kll lineshape changes as the number of 3d electrons increases across the rows of the transition metals, and as the nonmetalloid atom changes from C to N to 0. The effects of sample nonstoichiometry were also examined. Originator supplied keywords include: Auger electron spectroscopy, Localization, Carbides, and Screening.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1984
Accession Number
ADA150865

Entities

People

  • David E. Ramaker
  • Pehr E. Pehrsson

Organizations

  • George Washington University

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • California
  • Chemical Engineering
  • Chemistry
  • Electron Spectroscopy
  • Electrons
  • Materials
  • Materials Science
  • Military Research
  • New Jersey
  • New York
  • Pennsylvania
  • Solid State Physics
  • Spectra
  • Transition Metals
  • United States

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene