A Scanning Optical Microprobe for Infrared Detector Measurement.

Abstract

An optical probe apparatus is described which has been used for mapping the responsivity and defects of a range of IR detectors and has been extended to measure minority carrier lifetime, ambipolar mobility, photoluminescence and diffusion length. Each use of the apparatus is illustrated with experimental results. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1984
Accession Number
ADA151748

Entities

People

  • H. A. Tarry

Organizations

  • Royal Signals and Radar Establishment

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Detection
  • Detectors
  • Diodes
  • Infrared Detectors
  • Lasers
  • Light Pulses
  • Light Sources
  • Materials
  • Measurement
  • Optical Properties
  • Optics
  • Photonic Metamaterials
  • Semiconductor Devices
  • Semiconductors
  • Shape
  • Surface Properties

Fields of Study

  • Physics

Readers

  • Semiconductor Device Technology