Manufacturing Methods and Technology for Digital Fault Isolation of Hybrid Microelectronic Assemblies. Attachment 1. Distributed Software Elements.
Abstract
This final report presents the results, supporting data, and recommendations relating to an automatic test probe system (Autoprobe or AP). The manufacturing technology effort described by this report covers automatic test and fault isolation of digital hybrid microelectronic devices (D/HMAs) used in current and future production missile systems. A need for the single automatic probe, or Autoprobe, system was established by high production rate test and fault isolation of D/HMAs having complex LSI, microprocessor devices, and large number of I/O interconnections. An overview and objectives of project 1023 (or HFI Program) are presented in Section 1 of this report. Section 2 describes the work accomplished and includes the successful results of the Industry Demonstration for test and fault isolation of a D/HAM. Section 3 contains recommendations to achieve a full production type Autoprobe system and suggested future effort or study towards necessary AP improvements. This document only provides two Fortran language programs and two machine language programs that were compiled.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1982
- Accession Number
- ADA152687
Entities
Organizations
- Hughes Aircraft Company