High Precision Materials Characterization in the Near Millimeter Wave-Length Range.

Abstract

A double-beam instrument developed in this laboratory has been used to measure the complex indices of refraction of various material at 245 GHz. We report here the results for crystal quartz, water free fused quartz (Spectrasil WF), silicon, beryllia, boron nitride (grade HP), and a nickel ferrite (Trans-Tech 2-111). We compare our results with the results obtained by other researchers using different techniques as available. Keywords include: Near millimeter waves; Optically pumped molecular laser; Crystal quartz; Spectrasil WF; Silicon; Beryllium oxide; HP boron nitrides; and Nickel ferrite.

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Document Details

Document Type
Technical Report
Publication Date
Feb 07, 1985
Accession Number
ADA153267

Entities

People

  • C. R. Jones
  • J. M. Dutta

Organizations

  • North Carolina College

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Ceramic Materials
  • Coefficients
  • Detectors
  • Dielectric Properties
  • Dielectric Waveguides
  • Frit
  • Glass
  • Materials
  • Materials Laboratories
  • Measurement
  • Millimeter Waves
  • Molecular Lasers
  • Optical Materials
  • Refraction
  • Refractive Index
  • Silica Glass

Fields of Study

  • Physics

Readers

  • Microwave Engineering.
  • Spectroscopy.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • 5G
  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition