High Temperature Electronics Technology. Life Test Report.
Abstract
This report presents the results of a series of life tests of silicon Integrated Injection Logic (I2L) microcircuits designed to operate for long periods at temperatures as high as 300 C. The technology needed to design and fabricate these microcircuits was previously developed under Contract N00173-79-C-0010. Two life tests were conducted: an operating-life test at 300 C and a nonoperating-life test at 360 C. Ten chip packages, each containing four identical ring oscillator/counter test circuits, were tested at each temperature. A total of 80 microcircuits were fabricated using two different metallization processes. None of the 300 C test specimens failed; 24 circuits of the 40 completed 3206 hours, and 16 completed 2342 hours.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1984
- Accession Number
- ADA154681
Entities
People
- D. J. Lacombe
Organizations
- General Electric