The Optimality of Lower Confidence Limits for the Reliability of Series Systems Obtained by the Method of Key Test Results or other Related Techniques.

Abstract

In order to obtain lower confidence limits for the reliability of series systems using binomial subsystem data, K. A. Weaver introduced the method of 'key test results' . This work was extended by A. Winterbottom. In the present paper, conditions are obtained under which the 'method of key test results' gives Buehler optimal lower confidence limits identical with those given by the ordering induced by the maximum likelihood estimator. Keywords: System reliability; Reliability estimation; Key test results; Buehler optimality.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1985
Accession Number
ADA154880

Entities

People

  • A. P. Soms
  • B. Harris

Organizations

  • University of Wisconsin–Madison

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Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Binomials
  • Classification
  • Computations
  • Confidence Limits
  • Contracts
  • Convex Sets
  • Data Science
  • Equations
  • Estimators
  • Information Science
  • Mathematics
  • Numbers
  • Probability
  • Random Variables
  • Statistical Analysis
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  • United States

Fields of Study

  • Engineering

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  • Regression Analysis.